Massive cluster ablation as preparation for organic secondary ion imaging

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Abstract
A focused Cs+ beam was used to obtain secondary ion mass spectra and images from samples of stearic acid on gold before and after ablation by a beam of masive cluster ions. Ablation appears to have two effects on secondary ion emission. First, the number and intensity of peaks reflecting contamination are substantially reduced. Secondly, the absolute intensity of secondary ion current characteristic of the analyte increases. These features simplify mass spectra and improve contrast in the images obtained.