Abstract
A simple method for spreading polystyrene‐latex spheres onto mica substrates to form highly crystalline layers is described. These layers can be used as a simple calibration standard for the atomic force microscope in the nanometer to micron size range. In particular, they provide simultaneous x, y, and z calibration. The concentration of particles of about 0.01% is found to be good for forming ordered structures. Two‐dimensional polycrystalline structures of polytstyrene spheres with different packing orders (cubic and hexagonal close‐pack) and some defects (vacancies, dislocations, and grain boundaries) were observed.

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