Testing for Intermittent Faults in Digital Circuits
- 1 March 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-22 (3) , 241-246
- https://doi.org/10.1109/t-c.1973.223701
Abstract
In this paper we present a few fundamental results related to the problems of characterization and detection of intermittent faults in digital circuits, which, up to now, have been almost totally ignored. This problem is important since in many technologies intermittency is a predominant mode of failure.Keywords
This publication has 4 references indexed in Scilit:
- A Heuristic Algorithm for the Testing of Asynchronous CircuitsIEEE Transactions on Computers, 1971
- Comments on "Fault Testing and Diagnosis in Combinational Digital Circuits"IEEE Transactions on Computers, 1969
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Design and Use of Fault Simulation for Saturn Computer DesignIEEE Transactions on Electronic Computers, 1967