Diffraction limitations for plasma electron density measurements with schlieren methods
- 1 October 1975
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 14 (10) , 2537-2541
- https://doi.org/10.1364/ao.14.002537
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- Quantitative Schlieren Techniques Applied to High Current Arc InvestigationsApplied Optics, 1972
- An infrared Schlieren interferometer for measuring electron density profilesPlasma Physics, 1972