Ice thickness and low-energy Si(Li) detector efficiency measurements

This publication has 13 references indexed in Scilit:

• State-of-the-art efficiency determination for a Si(Li) X-ray detector in the 3–40 keV energy range
  Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
• M-shell X-ray emission for determining the low energy efficiency of Si(Li) detectors
  Nuclear Instruments and Methods in Physics Research, 1982
• A radially dependent photopeak efficiency model for Si(Li) detectors
  Nuclear Instruments and Methods, 1980
• Efficiency calibration of a Si(Li) X-ray detector in the 1.5–60 keV energy region
  Nuclear Instruments and Methods, 1980
• Thickness measurement of gold contact layers in Si(Li) and Ge x‐ray detectors
  Journal of Applied Physics, 1980
• A simple method for preparing thin 241Am sources
  Nuclear Instruments and Methods, 1979
• Atomic electron binding energies
  Atomic Data and Nuclear Data Tables, 1979
• Si(Li) detector efficiency for 0.7–6 keV X-ray energy region
  Nuclear Instruments and Methods, 1979
• Accurate efficiency calibration and properties of semiconductor detectors for low-energy photons
  Nuclear Instruments and Methods, 1973
• $M$-Subshell Fluorescence Yields and the $L_1-L_3$ Radiative Transition at $Z=93\mathrm{} \mathrm{and} 96$ from ${\mathrm{Am}}^{241}$ and ${\mathrm{Cf}}^{249}$ Decays
  Physical Review A, 1971