Testing by Verifying Walsh Coefficients
- 1 February 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-32 (2) , 198-201
- https://doi.org/10.1109/tc.1983.1676204
Abstract
Testing of logic networks by verifying the Walsh coefricients of the outputs is explored. Measurement of one of these can detect arbitrarily many input leads stuck, and just two measurements, requiring little hardware, can detect any single stuck-at fault in appropriately designed networks.Keywords
This publication has 5 references indexed in Scilit:
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