Structural Identification of SiC Polytypes by Raman Scattering: 27R and 33R Polytypes
- 15 January 1987
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 56 (1) , 359-364
- https://doi.org/10.1143/jpsj.56.359
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Relative Raman intensities of the folded modes in SiC polytypesPhysical Review B, 1986
- Raman scattering intensity of the long-period polytypes ofPhysical Review B, 1985
- A simplified method of generating layer sequences for SiC polytypesJournal of Materials Science, 1982
- The Raman effect in crystalsAdvances in Physics, 1964
- Intensities in Raman spectra I. A bond polarizability theoryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1953