A Pupil-scan Aberration Analyser
- 1 February 1972
- journal article
- research article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 19 (2) , 105-119
- https://doi.org/10.1080/713818530
Abstract
The principles of operation of an instrument which can measure the wavefront aberrations, transverse-ray aberrations, and spot diagrams of an optical system are described. The instrument functions by scanning the pupil of the optical system with a ‘ray’ of light and measuring the coordinates of the point of intersection of the ray, with the image plane, using a position-sensitive detector. An image-dissector tube is used as the position-sensitive detector. The instrument also has a facility for generating a polynomial function which can be matched to the measured aberration curves in order to determine directly the aberration coefficients.Keywords
This publication has 3 references indexed in Scilit:
- Position-sensitive Photocells and Their Application to Static and Dimensional MetrologyOptica Acta: International Journal of Optics, 1969
- A Spot Diagram Generator for Lens TestingOptica Acta: International Journal of Optics, 1968
- New Electronic Wavefront PlotterApplied Optics, 1965