Photodisplacement microscopy using a semiconductor laser

2 September 1982

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 18 (18) , 763-764
https://doi.org/10.1049/el:19820516

Abstract

A photodisplacement microscope has been realised, using a modulated semiconductor laser as the heating source and a phase sensitive HeNe laser probe for detection. Experimental results indicate that the instrument can have a wide range of applicability, including problems in nondestructive examination.

Keywords

HEATING SOURCE
PHOTODISPLACEMENT MICROSCOPE
NONDESTRUCTIVE TESTING
PHASE SENSITIVE HENE LASER PROBE
MODULATED SEMICONDUCTOR LASER

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