Theoretical optimization and parametric study of n-on-p AlxGa1−xAs-GaAs graded band-gap solar cell
- 1 July 1976
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 47 (7) , 3152-3158
- https://doi.org/10.1063/1.323109
Abstract
A comprehensive theoretical model of the graded band‐gap AlxGa1−xAs‐GaAs solar cell is used to optimize the n‐on‐p cell. The model includes power losses due to surface, bulk, and junction minority‐carrier recombination, series resistance, and photon reflection from an SiO antireflection coating of optimum thickness. The optimized cell has a junction depth/graded band‐gap layer thickness of 1.0 μm, respective donor and acceptor concentrations of 4×1017 and 2×1017 cm−3, and a surface AlAs mole fraction of x=0.35. The optimized graded band‐gap cell has an air‐mass‐zero efficiency of 17.7% (not corrected for a 13% front surface contact area) and is shown to be less sensitive than a similar n‐on‐p GaAs cell to material degradation in the form of decreased minority‐carrier diffusion lengths and increased surface‐recombination velocity.This publication has 10 references indexed in Scilit:
- Theoretical analysis of AlxGa1−xAs-GaAs graded band-gap solar cellJournal of Applied Physics, 1976
- High−efficiency graded band−gap AlxGa1−xAs−GaAs solar cellApplied Physics Letters, 1975
- Electrical properties of n-type AlxGa1–xAs single crystalsPhysica Status Solidi (a), 1973
- Variation of minority-carrier diffusion length with carrier concentration in GaAs liquid-phase epitaxial layersJournal of Applied Physics, 1973
- Photovoltaic effects in graded bandgap structuresIEEE Transactions on Electron Devices, 1971
- Direct and Indirect Optical Energy Gaps of AlAsJournal of Applied Physics, 1971
- Calculated efficiencies of practical GaAs and Si solar cells including the effect of built-in electric fieldsSolid-State Electronics, 1970
- Theoretical analysis of the series resistance of a solar cellSolid-State Electronics, 1967
- Optical Absorption of Gallium Arsenide between 0.6 and 2.75 eVPhysical Review B, 1962
- Carrier Generation and Recombination in P-N Junctions and P-N Junction CharacteristicsProceedings of the IRE, 1957