History, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids
- 2 November 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 39 (1-4) , 135-159
- https://doi.org/10.1016/0304-3991(91)90193-a
Abstract
No abstract availableKeywords
This publication has 37 references indexed in Scilit:
- The study of self-organization processes in crystals by high-voltage electron microscopyUltramicroscopy, 1991
- Confirmation of vacancy-type stacking fault tetrahedra in quenched, deformed and irradiated face-centred cubic metalsPhilosophical Magazine A, 1989
- The need for improved temperature control during reactor irradiationJournal of Nuclear Materials, 1988
- Point Defect Processes in the Defect Structure Development from Cascade DamageMaterials Science Forum, 1987
- Conversion of stacking fault tetrahedra to voids in electron irradiated Fe-Cr-NiJournal of Nuclear Materials, 1986
- Evidence for stacking-fault tetrahedra formed from self-interstitials in electron-irradiated silverPhilosophical Magazine A, 1985
- Directional Arrangement of Defect Clusters in Electron-Irradiated CopperJournal of the Physics Society Japan, 1975
- Point Defect Clusters in Electron-Irradiated GoldJournal of the Physics Society Japan, 1973
- Analysis of the Clustering Process of Supersaturated Lattice VacanciesJournal of the Physics Society Japan, 1973
- Anomalous electron absorption effects in metal foils: theory and comparison with experimentProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1962