A kinematic specimen goniometer stage for the Siemens electron microscope

• 1 June 1962
• journal article
• Published by IOP Publishing in British Journal of Applied Physics
• Vol. 13  (6) , 264-265
• https://doi.org/10.1088/0508-3443/13/6/304

Abstract

Keywords

• ELECTRON MICROSCOPE
• KINEMATIC SPECIMEN
• SPECIMEN GONIOMETER
• GONIOMETER STAGE
• SIEMENS ELECTRON