Pulsed laser deposition of thick YBa2Cu3O7−δ films with J c≥1 MA/cm2

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Abstract
Using pulsed laser deposition, YBa2Cu3O7−δ(YBCO)films ranging in thickness from 0.065 to 6.4 μm have been deposited on yttria‐stabilized zirconia substrates with an intermediate layer of CeO2. The thinnest films have critical current densities of over 5 MA/cm2 at 75 K with zero applied field; as film thickness is increased, J c decreases asymptotically to 1 MA/cm2. X‐ray analysis of a 2.2‐μm‐thick film shows that the YBCO is predominantly c‐axis oriented and textured in‐plane, while a Rutherford backscattering spectrometry minimum channeling yield of ≊75% indicates that the film contains disordered material at this thickness.