LIQUID-FILM-MEDIATED SCANNING THERMAL MICROSCOPY OF A MAGNETORESISTIVE READING HEAD

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Abstract
Magnetoresistive (MR) heads containing 45-nm-wide permalloy (NiFe) thin films require current densities on the order of 1011 A/m2 for reading operation, resulting in heat generation rates of 1015 W/m3. Scanning thermal microscopy (SThM) showed a maximum temperature rise of 20C, an average temperature gradient higher than 106 K/m, and heat flux of 108 W/m2 near the MR element. Topography-induced features on the order of 20 - 25 nm in size were observed in the thermal images. Estimation of tip - sample thermal resistance, experiments in different environments, as well as calculations of liquid film thickness and thermal resistance suggested that the dominant tip - sample heat conduction was dominated by a liquid film bridge. This also explained the topography-induced nanoscale thermal features.

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