Ionic heterogeneities in sulfonated polysulfone films

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Abstract
Measurements of glass transition temperature, small‐angle x‐ray scattering (SAXS), and transmission electron microscopy (TEM) have been applied to the study of ionic heterogeneities in sulfonated polysulfone (SPS) films. The SAXS study confirms the existence of heterogeneities in the electron density distribution, whose appearence for the Cs+1, Ca+2, and Fe+3 forms of SPS but not for H+ suggests that the scattering centers are ion‐containing regions. However, a TEM study could not detect the existence of microseparated regions down to a level of 50 Å and the Tg behavior as a function of IEC was more typical of that for random copolymers. A Mössbauer study, performed earlier by Heitner‐Wirguin et al. on samples of our material, indicated the existence of clusters ∼35–40 Å in diameter.