Circuit technologies for 16Mb DRAMs

• 23 March 2005
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 22-23
• https://doi.org/10.1109/isscc.1987.1157158

Abstract

Keywords

• ERROR CORRECTION CODES
• FLIP-FLOPS
• CMOS TECHNOLOGY
• RANDOM ACCESS MEMORY
• CMOS PROCESS
• DRAM CHIPS
• CIRCUIT TESTING
• CAPACITANCE
• LOW VOLTAGE
• THRESHOLD VOLTAGE