Multifrequency measurement of testability with application to large linear analog systems
- 1 June 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 33 (6) , 644-648
- https://doi.org/10.1109/tcs.1986.1085956
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Fault diagnosis for linear systems via multifrequency measurementsIEEE Transactions on Circuits and Systems, 1979