A Solution of the Earthed Fin Line with Finite Metallization Thickness
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 80, 258-260
- https://doi.org/10.1109/mwsym.1980.1124252
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Equivalent relative permittivity and unloaded Q factor of integrated finlineElectronics Letters, 1973
- On the Complete Eigenvalue Solution of Ridged WaveguideIEEE Transactions on Microwave Theory and Techniques, 1971