Optimal replacement of damaged devices
- 1 March 1978
- journal article
- Published by Cambridge University Press (CUP) in Journal of Applied Probability
- Vol. 15 (1) , 153-161
- https://doi.org/10.2307/3213245
Abstract
A device is subject to a sequence of shocks occurring randomly at times n = 1, 2, ⃛. At each point in time, shocks occur according to a Poisson distribution with parameter λ. Shocks cause damage and damage accumulates additively. They can cause the device to fail, and the probability of such a failure depends on the accumulated damage. Failure occurs because of shocks and can occur only at times n = 1, 2, ⃛. The device can be replaced before or at failure. If the device fails it is immediately replaced at a fixed cost. Replacement before failure can only occur at times n = 1, 2, ⃛, and is done at a lower cost depending on the amount of accumulated damage at replacement. In this paper we determine the optimal replacement policy that minimizes the expected cost per unit time.Keywords
This publication has 5 references indexed in Scilit:
- Optimality of the one step look-ahead stopping timesJournal of Applied Probability, 1977
- Optimal replacement with semi-Markov shock modelsJournal of Applied Probability, 1976
- Shock models with underlying birth processJournal of Applied Probability, 1975
- Optimal replacement under additive damage and other failure modelsNaval Research Logistics Quarterly, 1975
- Nonstationary shock modelsStochastic Processes and their Applications, 1973