Direct measurements of /sup 4/I/sub 11/2/ terminal-level lifetime in Nd:YLF
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 31 (10) , 1742-1746
- https://doi.org/10.1109/3.466047
Abstract
No abstract availableKeywords
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