Physical methods of surface analysis

This publication has 7 references indexed in Scilit:

• Principles and applications of ion beam techniques for the analysis of solids and thin films
  Thin Solid Films, 1973
• Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
  Surface Science, 1973
• Analysis of the outermost atomic layer of a surface by low-energy ion scattering
  Surface Science, 1973
• Diffusion barrier model for the cyanide ion-selective electrode
  Analytical Chemistry, 1972
• Auger electron spectroscopy and its application to surface studies
  Review of Physics in Technology, 1972
• Electron probe microanalysis
  Surface Science, 1971
• A Discussion on photoelectron spectroscopy - Electron spectroscopy for chemical analysis (e.s.c.a.)
  Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1970