Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes
- 26 January 2004
- journal article
- research article
- Published by Wiley in Electroanalysis
- Vol. 16 (1-2) , 60-65
- https://doi.org/10.1002/elan.200302918
Abstract
No abstract availableKeywords
This publication has 35 references indexed in Scilit:
- Peer Reviewed: Atomic Force Microscopy Probes Go ElectrochemicalAnalytical Chemistry, 2002
- Localised electrochemical impedance spectroscopy with high lateral resolution by means of alternating current scanning electrochemical microscopyElectrochemistry Communications, 2002
- Electroanalytical measurements using the scanning electrochemical microscopeAnalytica Chimica Acta, 2000
- Combined Scanning Electrochemical−Atomic Force MicroscopyAnalytical Chemistry, 1999
- High resolution studies of heterogeneous processes with the scanning electrochemical microscopeMicrochimica Acta, 1999
- Scanning electrochemical microscopy: beyond the solid/liquid interfaceAnalytica Chimica Acta, 1999
- Electrochemistry Using Single Carbon NanotubesJournal of the American Chemical Society, 1999
- Scanning Electrochemical Microscopy with Shear Force Feedback Investigation of the Lateral Resolution of Different Experimental ConfigurationsElectrochemical and Solid-State Letters, 1999
- Scanning electrochemical microscopy. 15. Improvements in imaging via tip-position modulation and lock-in detectionAnalytical Chemistry, 1992
- Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric ScaleScience, 1991