Electron Microprobe Analysis of the Mixing Profile of Ge–Si Alloyed Heterojunctions
- 1 August 1967
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (9) , 3798-3799
- https://doi.org/10.1063/1.1710223
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Temperature Gradients in Semiconductor Alloying TechnologyJournal of Applied Physics, 1965