Tests of the methods of analysis of picosecond lifetimes and measurement of the half-life of the 569.6 keV level in 207Pb
- 1 May 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 151 (1-2) , 221-225
- https://doi.org/10.1016/0029-554x(78)90492-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Short nuclear lifetime measurements via the pulse beam delayed-coincidence techniqueNuclear Instruments and Methods, 1971
- A versatile delayed coincidence systemNuclear Instruments and Methods, 1971
- Effective nuclear moments in 207PbNuclear Physics, 1966
- The Structure of Atoms from Diffraction StudiesPhysical Review B, 1950