Superconductivity in ultra-thin CoSi2 epitaxial films
- 1 January 1985
- journal article
- Published by EDP Sciences in Journal de Physique Lettres
- Vol. 46 (20) , 979-983
- https://doi.org/10.1051/jphyslet:019850046020097900
Abstract
The first results on the superconducting properties of ultra-thin epitaxial CoSi2 films are reported. The metal films are obtained by solid phase epitaxy under ultra high-vacuum conditions, with thicknesses ranging from 600 Å down to 50 A. These films are stable against temperature cycling from 350 mK up to room temperature and superconducting for thicknesses down to 100 Å. Results showing a reduction of the transition temperature and variations of the critical magnetic field with decreasing film thicknesses are presented. Furthermore, for very low film thicknesses (i.e. 100 A), an intermediate plateau is observed in the resistivity versus temperature curve. The physical origin of these phenomena is briefly discussedKeywords
This publication has 8 references indexed in Scilit:
- Diverging Characteristic Lengths at Critical Disorder in Thin-Film SuperconductorsPhysical Review Letters, 1985
- Specular Boundary Scattering and Electrical Transport in Single-Crystal Thin Films of CoPhysical Review Letters, 1985
- Transistor effect in monolithic Si/CoSi 2 /Si epitaxial structuresElectronics Letters, 1984
- Electrical transport properties of CoSi2 and NiSi2 thin filmsApplied Physics Letters, 1984
- Epitaxial silicidesThin Solid Films, 1982
- Scaling Theory of Localization: Absence of Quantum Diffusion in Two DimensionsPhysical Review Letters, 1979
- Survey of superconductive materials and critical evaluation of selected propertiesJournal of Physical and Chemical Reference Data, 1976
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938