Top‐Oxidation Effects on the Reliability of Oxide‐Nitride‐Oxide Stacked Film
- 1 October 1993
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 140 (10) , 2975-2981
- https://doi.org/10.1149/1.2220942
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: