Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant
- 1 January 1980
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 24, 111-120
- https://doi.org/10.1154/s0376030800007205
Abstract
Calibrated powder patterns of a number of high symmetry crystalline materials were recorded in three different Guinier-type focusing cameras. The films were then measured by three different techniques, one visual and two instrumental. Cell parameters were calculated by three different data reduction procedures. The aim of the work was to establish the level of reproducibility for cell parameters obtained in routine work with these instruments.Keywords
This publication has 1 reference indexed in Scilit:
- A silicon powder diffraction standard reference materialJournal of Applied Crystallography, 1975