Single-element rotating-polarizer ellipsometer: PSI meter
- 30 June 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 96 (1-3) , 168-173
- https://doi.org/10.1016/0039-6028(80)90301-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Single-element rotating-polarizer ellipsometer for film-substrate systemsJournal of the Optical Society of America, 1977
- Combined reflection and transmission thin-film ellipsometry: a unified linear analysisApplied Optics, 1975
- Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*Journal of the Optical Society of America, 1975
- Determination of the Optical Constants of Solids by Reflectance-Ratio Measurements at Non-Normal IncidenceJournal of the Optical Society of America, 1972