Heavy ion test results on memories

Publisher Website

2 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/redw.1992.247328

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

SEU characterization of a hardened CMOS 64K and 256K SRAM
IEEE Transactions on Nuclear Science, 1989
Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles
IEEE Transactions on Nuclear Science, 1987