X-Ray Diffractometer Attachment for Direct Observation of Evaporated Thin Films
- 1 July 1963
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 34 (7) , 792-793
- https://doi.org/10.1063/1.1718576
Abstract
An ultra‐high vacuum apparatus in which materials can be evaporated onto substrates at various temperatures has been developed. Without breaking the vacuum, x‐ray diffraction observations can be made over the angular 2θ range normally used on an x‐ray diffractometer. Continuous pumping during evaporation, anneal, and measurement is obtained by use of an ion pump.Keywords
This publication has 3 references indexed in Scilit:
- X-ray studies of deformed metalsProgress in Metal Physics, 1959
- An X-ray Study in High Vacuum of the Structure of Evaporated Copper FilmsProceedings of the Physical Society. Section B, 1956
- Röntgenographische Untersuchungen an kondensierten Zinnfilmen bei tiefen TemperaturenThe European Physical Journal A, 1954