Stability of Nickel-Chromium Thin Film Resistors
- 1 June 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Parts, Hybrids, and Packaging
- Vol. 8 (2) , 10-13
- https://doi.org/10.1109/tphp.1972.1136569
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Vacuum-deposited metal film resistorsBritish Journal of Applied Physics, 1961