Optimum Redundancy Using Loss Functions
- 1 September 1968
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-17 (3) , 181-182
- https://doi.org/10.1109/TR.1968.5216936
Abstract
A technique for synthesizing reliable systems using parallel redundancy at the subsystem level is described. The specification of a loss function allows the calculation of the average expected loss which can be used to determine the optimum amount of redundancy for a given application. This optimum is statistical and therefore applicable only when the mission is performed many times.Keywords
This publication has 1 reference indexed in Scilit:
- Digital Circuit RedundancyIEEE Transactions on Reliability, 1964