Abstract
A closed-loop positioning system is described which is capable of sub-nanometer precision over displacements of up to 100 micrometers. The technique utilizes piezo-electric or electrostrictive translators in conjunction with capacitance displacement sensors. It has been applied in optical interferometry for path length control to picometer precision, and in X-Y stages developed for scanning probe microscopy.

This publication has 0 references indexed in Scilit: