Measurement of diffusion profile of Zn in n-type GaAs by a spreading resistance technique
- 1 July 1967
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 10 (7) , 727-728
- https://doi.org/10.1016/0038-1101(67)90101-3
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- A Spreading Resistance Technique for Resistivity Measurements on SiliconJournal of the Electrochemical Society, 1966
- Diffusion with Interstitial-Substitutional Equilibrium. Zinc in GaAsPhysical Review B, 1963