Microstructural characterisation of CuInS2 polycrystalline films sulfurised by rapid thermal processing
- 1 May 2001
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 387 (1-2) , 219-221
- https://doi.org/10.1016/s0040-6090(00)01836-8
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- MicroRaman scattering from polycrystalline CuInS 2 films: structural analysisThin Solid Films, 2000