Electron Microscope Study of the Roughness of Permalloy Films Using Surface Replication
- 1 March 1962
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (3) , 1115-1116
- https://doi.org/10.1063/1.1728623
Abstract
Permalloy films evaporated at normal and oblique incidence to a substrate were examined by replication of their surfaces. Electron micrographs revealed chains of particles perpendicular to the incident beam. The degree of alignment and the lengths of the chains depended upon the angle of incidence and the film thickness. A statistical analysis of the micrographs was made. The magnetic data showed a discrepancy between the magnetic thickness and the optical thickness for oblique incidence films.This publication has 4 references indexed in Scilit:
- The dependence of the uniaxial magnetic anisotropy in evaporated films on the angle of incidenceCzechoslovak Journal of Physics, 1961
- Anisotropy in Permalloy Films Evaporated at Grazing IncidenceJournal of Applied Physics, 1961
- Oblique-Incidence Anisotropy in Evaporated Permalloy FilmsJournal of Applied Physics, 1960
- Evaporated carbon films for use in electron microscopyBritish Journal of Applied Physics, 1954