Non-destructive electron microscopic examination with rotation of beveled micropipette electrode tips
- 1 April 1980
- journal article
- research article
- Published by Elsevier in Journal of Neuroscience Methods
- Vol. 2 (2) , 163-167
- https://doi.org/10.1016/0165-0270(80)90057-6
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Dry beveling of micropipette electrodesJournal of Neuroscience Methods, 1980
- A scanning electron microscope method for the examination of glass microelectrode tips either before or after useCellular and Molecular Life Sciences, 1975