Measurements of substrate carrier lifetimes in silicon-on-insulator wafers by a contactless dual-beam optical modulation technique
- 31 July 1992
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 35 (7) , 927-932
- https://doi.org/10.1016/0038-1101(92)90320-c
Abstract
No abstract availableKeywords
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