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Performance of an improved InGaAsP ridge waveguide laser at 1.3 μm
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Performance of an improved InGaAsP ridge waveguide laser at 1.3 μm
Performance of an improved InGaAsP ridge waveguide laser at 1.3 μm
IK
I.P. Kaminow
I.P. Kaminow
RN
R.E. Nahory
R.E. Nahory
LS
L.W. Stulz
L.W. Stulz
JD
J.C. Dewinter
J.C. Dewinter
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30 April 1981
journal article
Published by
Institution of Engineering and Technology (IET)
in
Electronics Letters
Vol. 17
(9)
,
318-320
https://doi.org/10.1049/el:19810225
Abstract
Single-mode, CW ridge lasers at 1.3 μm have been made with threshold currents as low as 125 mA at 25°C using a symmetrical wafer structure. Performance is interpreted in terms of ridge guiding and injected carrier antiguiding.
Keywords
SYMMETRICAL WAFER STRUCTURE
RIDGE WAVEGUIDE LASER
1.3 MICRONS
SEMICONDUCTOR JUNCTION LASER
RIDGE GUIDING
INJECTED CARRIER ANTIGUIDING
INGAASP
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