Atomic Spectrometry Update—Inorganic Mass Spectrometry and X-Ray Fluorescence Spectrometry
- 1 January 1990
- journal article
- review article
- Published by Royal Society of Chemistry (RSC) in Journal of Analytical Atomic Spectrometry
- Vol. 5 (7) , 243R-277R
- https://doi.org/10.1039/ja990050243r
Abstract
This year's Update includes an extended mass spectrometry section based on full abstracts and covering fully this extensive area of analysis. The newly introduced instrumentation for Glow discharge MS and the combined MS techniques are particularly notable this year. The ICP-MS section continues to grow in line with the increasing number of instruments in use for an ever-expanding variety of applications. The growth of interest in TXRF and synchrotron radiation XRF has been particularly high during the review period.Keywords
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