GENETIC MEASUREMENT OF THE HALF LIFE OF Bi207
- 1 January 1959
- journal article
- Published by Canadian Science Publishing in Canadian Journal of Physics
- Vol. 37 (1) , 1-4
- https://doi.org/10.1139/p59-001
Abstract
The half life of Bi207 has been measured by the genetic method, using the parent–daughter pair Po207 and Bi207. Both activities are electron capturers, and the measured half life depends only on the activity ratio between them. The value found, T½ = 28±3 years, agrees with one of three previous determinations of this half life.Keywords
This publication has 1 reference indexed in Scilit:
- Minutes of the 1955 Spring Meeting Held at Washington, D. C., April 28-30, 1955Physical Review B, 1955