Elastic wave transmission at an abrupt junction in a thin plate with application to heat transport and vibrations in mesoscopic systems
Top Cited Papers
- 8 August 2001
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 64 (8) , 085324
- https://doi.org/10.1103/physrevb.64.085324
Abstract
The transmission coefficient for vibrational waves crossing an abrupt junction between two thin elastic plates of different widths is calculated. These calculations are relevant to ballistic phonon thermal transport at low temperatures in mesoscopic systems and the Q for vibrations in mesoscopic oscillators. Complete results are derived in a simple scalar model of the elastic waves, and results for long-wavelength modes are obtained using full elasticity theory. We suggest that thin-plate elasticity theory provides a useful and tractable approximation to the three-dimensional geometry.Keywords
All Related Versions
This publication has 14 references indexed in Scilit:
- Energy dissipation in suspended micromechanical resonators at low temperaturesPhysica B: Condensed Matter, 2000
- Measurement of the quantum of thermal conductanceNature, 2000
- Measurement of mechanical resonance and losses in nanometer scale silicon wiresApplied Physics Letters, 1999
- Quantum energy flow in mesoscopic dielectric structuresPhysical Review B, 1999
- Quantized Thermal Conductance of Dielectric Quantum WiresPhysical Review Letters, 1998
- Heat transport in mesoscopic systemsSuperlattices and Microstructures, 1998
- Fabrication of nanoelectromechanical systems in single crystal silicon using silicon on insulator substrates and electron beam lithographyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1997
- Direct thermal conductance measurements on suspended monocrystalline nanostructuresApplied Physics Letters, 1997
- Low-temperature anomalies in the dissipation of small mechanical resonatorsEurophysics Letters, 1996
- Low temperature mechanical properties of boron-doped siliconPhysical Review Letters, 1992