IRE Standards on Solid-State Devices: Methods of Testing Transistors, 1956
- 1 January 1956
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 44 (11) , 1542-1561
- https://doi.org/10.1109/jrproc.1956.274874
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Transistor metrologyTransactions of the IRE Professional Group on Electron Devices, 1954
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- Standards on Electron Tubes: Methods of Testing, 1950: Part IProceedings of the IRE, 1950
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- Equivalent Circuits of Linear Active Four-Terminal Networks*Bell System Technical Journal, 1948
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