Adaptation of a Geiger-Counter X-Ray Diffractometer for High-Temperature Investigations
- 1 July 1954
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 25 (7) , 683-688
- https://doi.org/10.1063/1.1771159
Abstract
The construction of a specimen holder and furnace for use as an auxilary piece of equipment with a North American Phillips Company high angle goniometer is described. The apparatus can be used for obtaining x‐ray diffraction patterns at temperatures up to 1600°C, and at pressures in the range of 2×10−6 to 3×10−5 mm of mercury.Keywords
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