Practical peak area measurements in X‐ray photoelectron spectroscopy
- 1 December 1981
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 3 (6) , 272-274
- https://doi.org/10.1002/sia.740030608
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972