Detection of secondary electrons in a multidipole plasma
- 1 July 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (7) , 5330-5332
- https://doi.org/10.1063/1.329880
Abstract
Secondary electrons are identified as a separate component within a plasma in a specifically modified multidipole device. It is shown that secondary electron emission at walls can be comparable to electron production by ionization. It is also shown that secondary electron emission can significantly change Langmuir probe characteristics.This publication has 4 references indexed in Scilit:
- Electrostatic plugging of leaks in a multidipole deviceJournal of Applied Physics, 1982
- Plasma confinement by localized cuspsPhysics of Fluids, 1976
- Optimization of permanent magnet plasma confinementPhysics Letters A, 1975
- Existence and stability of strong potential double layersAstrophysics and Space Science, 1974