Lapping Machine Attachment for Preparing Oriented Crystals

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Abstract
The description and use of a lapping attachment for the preparation of x‐ray oriented reference surfaces on crystal specimens is presented. The surfaces are prepared on specimens which have been mounted and oriented on a goniometer device. The resulting prepared surface provides a reference face for machine finishing a crystal sample with all faces in a known relation to the crystalline axis or planes. Test runs of various specimens have produced finished surfaces that have retained their original orientation within 0.1° of error.

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