The defect structure of thin oxide films on aluminum
- 1 November 1971
- journal article
- Published by Springer Nature in Oxidation of Metals
- Vol. 3 (6) , 523-527
- https://doi.org/10.1007/bf00604998
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Dielectric Properties of Crystalline Gamma-Al[sub 2]O[sub 3] Formed on Dilute Al-Cu AlloysJournal of the Electrochemical Society, 1970
- The Growth of Aluminum Oxide Films on Copper-Aluminum AlloysJournal of the Electrochemical Society, 1968
- The kinetics of the oxidation of Al in oxygen at high temperatureCorrosion Science, 1967
- The Distribution of Defects in Aluminum Oxide Films near the Metal-to-Oxide InterfaceJournal of the Electrochemical Society, 1965
- A study of the structure of abraded metal surfacesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1955