Method for extending the range of low-frequency admittance measurements
- 1 November 1976
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 47 (11) , 1409-1410
- https://doi.org/10.1063/1.1134537
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- High precision capacitance bridge for studying lipid bilayer membranesReview of Scientific Instruments, 1975
- Determination of the density and the relaxation time of silicon-metal interfacial statesSolid-State Electronics, 1975
- Automatic Plotting of Conductance and Capacitance of Metal-Insulator-Semiconductor Diodes or Any Two Terminal Complex AdmittanceReview of Scientific Instruments, 1966