Methods for characterization of coating microstructures
- 17 November 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 73 (2) , 331-345
- https://doi.org/10.1016/0040-6090(80)90497-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The influence of ion sputtering on the elemental analysis of solid surfacesThin Solid Films, 1979
- Annealing studies of TiC and (Ti, V)C structures prepared by activated reactive evaporationThin Solid Films, 1979
- Microstructure of amorphous 304 stainless steel-carbon alloys synthesized by magnetron sputter depositionThin Solid Films, 1979
- Transmission electron microscopy studies of electron beam co-evaporated Nb3Sn-Cu superconducting compositesThin Solid Films, 1978